摘要 : Organic field effect transistors (OFETs) are widely known to suffer from exposure to environmental factors such as humidity and air. OFETs are also degraded under electrical bias stress test performed in the atmosphere. However, e... 展开
作者 | Yoon~ H. Sung~ H. Kim~ H. |
---|---|
作者单位 | |
期刊名称 | 《Journal of the Korean Physical Society》 |
总页数 | 5 |
语种/中图分类号 | 英语 / O4 |
关键词 | Ambient Bias-stress test Degradation OFETs OTFT Reliability Stability Vacuum |
馆藏号 | N2008EPST0005902 |