摘要 : In this letter, we investigated the gate insulator morphology affecting on the electric characteristic variation for organic thin-film transistors (OTFTs). From the transfer characteristics, there is a result with leakage current ... 展开
作者 | Chen~ Hua-Mao Chang~ Ting-Chang Tai~ Ya-Hsiang Chiang~ Hsiao-Cheng Liu~ Kuan-Hsien Chen~ Min-Chen Huang~ Cheng-Chieh Lee~ Chao-Kuei |
---|---|
作者单位 | |
期刊名称 | 《Electron Device Letters, IEEE》 |
页码/总页数 | 228-230 / 3 |
语种/中图分类号 | 英语 / TN6 |
关键词 | OTFT morphology reliability |
馆藏号 | IELEP0098 |