摘要 : RF circuit design in deep-submicrometer CMOS technologies relies heavily on accurate modeling of thermal noise. Based on Nyquist's law, predictive modeling of thermal noise in MOSFETs was possible for a long time, provided that pa... 展开
作者 | Smit~ G.D.J. Scholten~ A.J. Pijper~ R.M.T. Tiemeijer~ L.F. |
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作者单位 | |
期刊名称 | 《IEEE Transactions on Electron Devices》 |
页码/总页数 | 245-254 / 10 |
语种/中图分类号 | 英语 / TN |
关键词 | Compact model PSP model RF CMOS RF noise excess noise noise figure thermal noise |
DOI | 10.1109/TED.2013.2282960 |
馆藏号 | IELEP0099 |