摘要 : The utilization of wide band-gap semiconductor devices provides the possibility of higher switching frequency and power density for power converters. However, the influence of parasitic parameters becomes more significant. It dete... 展开
作者 | Wuji Meng Fanghua Zhang Guangdong Dong Jianping Wu Lin Li |
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作者单位 | |
期刊名称 | 《Power Electronics, IEEE Transactions on》 |
页码/总页数 | 4287-4299 / 13 |
语种 | 英语 |
关键词 | Parasitic capacitance Gallium nitride Loss measurement HEMTs MODFETs Bridge circuits Bridge circuits capacitance gallium nitride (GaN) losses parasitic temperature measurement |
DOI | 10.1109/TPEL.2020.3024881 |
馆藏号 | IELEP0199 |