摘要 : This paper presents a novel AC/DC noise measurement system. This system simultaneously uses a high DC current to generate 1/f/sup 2/ noise (electromigration noise) in thin films and a low AC current to detect that noise. This new ... 展开
| 作者 | Yassine~ A.M. Tsong-Ming Chen~ C. |
|---|---|
| 期刊名称 | 《IEEE Transactions on Electron Devices》 |
| 页码/总页数 | P.180-184 / 5 |
| 语种/中图分类号 | 英语 / TM10 TN |
| 关键词 | Noise measurement Electromigration Semiconductor device noise Noise generators Background noise Power measurement Current measurement Electrical resistance measurement Battery charge measurement Circuit noise |
| DOI | 10.1109/16.554808 |
| 馆藏号 | IELEP0099 |
