摘要 : Compact modeling of the most important high-frequency (HF) noise sources of the MOSFET is presented in this paper, along with challenges in noise measurement and deembedding of future CMOS technologies. Several channel thermal noi... 展开
作者 | M. Jamal Deen Chih-Hung Chen Saman Asgaran G. Ali Rezvani Jon Tao Yukihiro Kiyota |
---|---|
期刊名称 | 《IEEE Transactions on Electron Devices》 |
页码/总页数 | p.2062-2081 / 20 |
语种/中图分类号 | 英语 / TM10 TN |
关键词 | Compact noise modeling HF noise HF noise measurement MOS Noise Noise modeling Noise parameters RF CMOS noise RF compact MOS noise models RF MOS transistor noise RF Noise RF noise deembedding RF noise measurement |
DOI | 10.1109/TED.2006.880370 |
馆藏号 | IELEP0099 |