摘要 : Microwave noise performance of SiGe-based het-erostructure field effect transistors (HFETs) is presented. Noise parameters for devices with buried channel fabricated on several virtual substrates are discussed. The impact of such ... 展开
作者 | Mauro Enciso Aguilar Paul Crozat Thomas Hackbarth Hans-Joest Herzog Frederic Aniel |
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期刊名称 | 《IEEE Transactions on Electron Devices》 |
页码/总页数 | p.2409-2415 / 7 |
语种/中图分类号 | 英语 / TM10 TN |
关键词 | Computer-aided design (CAD) Heterostructure field-effect transistors (HFETs) Microwave noise Noise modeling Noise parameters SiGe Strained-silicon Virtual substrate (VS) |
DOI | 10.1109/TED.2005.857170 |
馆藏号 | IELEP0099 |