摘要 : In this paper we suggest an alternative method for the analysis of low frequency noise of transistors based on measurements of phase noise of a test oscillator. This method is demonstrated by experimental results obtained with a s... 展开
作者 | Milan M. Jevtic Jovan Hadzi-Vukovic Rifat Ramovic |
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作者单位 | |
期刊名称 | 《Microelectronics journal》 |
页码/总页数 | p.955-960 / 6 |
语种/中图分类号 | 英语 / TN4 |
关键词 | noise noise measurement low frequency noise phase noise oscillator noise noise simulation phase noise simulation oscillators |
馆藏号 | TN-122 |