摘要 : The random jitter performance of clock, oscillator, and timing circuits can be predicted by using steady-state circuit simulation techniques that determine phase noise by analyzing the impact on phase due to thermal, flicker, chan... 展开
作者 | Scott W. Wedge |
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期刊名称 | 《IEEE Circuits & Devices》 |
页码/总页数 | p.31-38 / 8 |
语种/中图分类号 | 英语 / TN47 |
关键词 | circuit noise clocks noise measurement oscillators phase noise random noise timing circuits timing jitter clock noise current simulation techniques electronic devices jitter measurements oscillator noise phase noise random jitter steady-state circuit sim |
馆藏号 | IELEP0032 |