[期刊]
  • 《International Journal of Applied Mathematics & Statistics》 2015年53卷5期

摘要 : Technology Acceptance Model (TAM) employed statistics method to validate the relation between constructs in the model. SEM is the most often statistics method that used in TAM analysis. Small sample is crucial problem in Structura... 展开

作者 M. A. Anggorowati  
作者单位
期刊名称 《International Journal of Applied Mathematics & Statistics》
总页数 6
语种/中图分类号 英语 / TB9  
关键词 TAM   SEM   SEM Bayesian  
馆藏号 N2012EPST0000381
相关作者
相关关键词