会议信息

召开年:

2019

召开地:

Las Vegas(US)

会议集名:

2019 56th ACM/IEEE Design Automation Conference

分类号:

TH1

相关会议
文章列表 共240条记录

作者: Xiaoyi Sun, Krishnendu Chakrabarty, Ruirui Huang, Yiquan Chen, Bing Zhao, Hai Cao, Yinhe Han, Xiaoyao Liang, Li Jiang    起始页:1

关键词: Hardware, Servers, Predictive models, Training, Feature extraction, Monitoring, Data centers


作者: Giulio Zizzo, Chris Hankin, Sergio Maffeis, Kevin Jones    起始页:1

关键词: Neural networks, Industrial control, Intrusion detection, Perturbation methods


作者: Hong Liu, Leibo Liu, Wenping Zhu, Qiang Li, Huiyu Mo, Shaojun Wei    起始页:1

关键词: Table lookup, Kernel, Convolution, Computational modeling, Energy efficiency, Image edge detection, Hardware


作者: Miloš Grujić, Vladimir Rožić, David Johnston, John Kelsey, Ingrid Verbauwhede    起始页:1

关键词: Entropy, Security, Field programmable gate arrays, Generators, Stochastic processes, NIST, Delays


作者: Rajit Karmakar, Suman Sekhar Jana, Santanu Chattopadhyay    起始页:1

关键词: Silicon, Automata, Additives, Logic gates, Flip-flops, Reverse engineering, Security


作者: Yajuan Du, Yao Zhou, Meng Zhang, Wei Liu, Shengwu Xiong    起始页:1

关键词: Three-dimensional displays, Flash memories, Engines, Error correction codes, Reliability, Iterative decoding


作者: Shijun Gong, Jiajun Li, Wenyan Lu, Guihai Yan, Xiaowei Li    起始页:1

关键词: Microsoft Windows, Kernel, Accelerator architectures, Field programmable gate arrays, Computational efficiency, Real-time systems


作者: Muhammad Abdullah Hanif, Faiq Khalid, Muhammad Shafique    起始页:1

关键词: Hardware, Buildings, Biological neural networks, Approximate computing, Computer architecture, Approximation error


作者: Heechun Park, Kyungwook Chang, Bon Woong Ku, Jinwoo Kim, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Saibal Mukhopadhyay, Krishnendu Chakrabarty, Sung Kyu Lim    起始页:1

关键词: Three-dimensional displays, Computer architecture, Two dimensional displays, Microprocessors, Tools, Built-in self-test


作者: Rafael Trapani Possignolo, Jose Renau    起始页:1

关键词: Table lookup, Routing, Field programmable gate arrays, Timing, Benchmark testing, Hardware, Runtime