摘要: Existing studies have uncovered that there exist significant Raw Bit Error Rates (RBERs) variations among different layers of 3D flash memories due to manufacture process variation. These RBER variations would cause significantly ... 展开
作者 | Yajuan Du Yao Zhou Meng Zhang Wei Liu Shengwu Xiong | ||
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作者单位 | |||
文集名称 | 2019 56th ACM/IEEE Design Automation Conference | ||
出版年 | 2019 | ||
会议名称 | ACM/IEEE Design Automation Conference | ||
页码 | 1-6 | 开始页/总页数 | 1 / 6 |
会议地点 | Las Vegas(US) | 会议年/会议届次 | 2019 / 56th |
关键词 | Three-dimensional displays Flash memories Engines Error correction codes Reliability Iterative decoding | ||
馆藏号 | IEL27261 (8806766) |