[会议]2019 56th ACM/IEEE Design Automation Conference  Yajuan Du, Yao Zhou, Meng Zhang, Wei Liu, Shengwu Xiong

摘要: Existing studies have uncovered that there exist significant Raw Bit Error Rates (RBERs) variations among different layers of 3D flash memories due to manufacture process variation. These RBER variations would cause significantly ... 展开

翻译摘要
作者 Yajuan Du   Yao Zhou   Meng Zhang   Wei Liu   Shengwu Xiong  
作者单位
文集名称 2019 56th ACM/IEEE Design Automation Conference
出版年 2019
会议名称 ACM/IEEE Design Automation Conference  
页码 1-6 开始页/总页数 1 / 6
会议地点 Las Vegas(US) 会议年/会议届次 2019 / 56th
关键词 Three-dimensional displays   Flash memories   Engines   Error correction codes   Reliability   Iterative decoding  
馆藏号 IEL27261 (8806766)
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