摘要: Monolithic 3D IC overcomes the limitation of the existing through-silicon-via (TSV) based 3D IC by providing denser vertical connections with nano-scale inter-layer vias (ILVs). In this paper, we demonstrate a thorough RTL-to-GDS ... 展开
作者 | Heechun Park Kyungwook Chang Bon Woong Ku Jinwoo Kim Edward Lee Daehyun Kim Arjun Chaudhuri Sanmitra Banerjee Saibal Mukhopadhyay Krishnendu Chakrabarty Sung Kyu Lim | ||
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作者单位 | |||
文集名称 | 2019 56th ACM/IEEE Design Automation Conference | ||
出版年 | 2019 | ||
会议名称 | ACM/IEEE Design Automation Conference | ||
页码 | 1-4 | 开始页/总页数 | 1 / 4 |
会议地点 | Las Vegas(US) | 会议年/会议届次 | 2019 / 56th |
关键词 | Three-dimensional displays Computer architecture Two dimensional displays Microprocessors Tools Built-in self-test | ||
馆藏号 | IEL27261 (8806766) |