摘要: We have developed tools for accurately and economically mapping and inspecting damage and artifacts in the bulk as well as on the surface of meter- sized optics intended for use on large-scale lasers such as Beamlet and NIF. Optic... 展开 We have developed tools for accurately and economically mapping and inspecting damage and artifacts in the bulk as well as on the surface of meter- sized optics intended for use on large-scale lasers such as Beamlet and NIF. Optics are illuminated by white light through the optic edge or externally at grazing incidence using linear fiber- optics arrays. The mega-pixel camera records a digital map of the entire optic with precise addresses of highlighted artifacts. From these coordinated, artifacts are located and digitally recorded with resolution of less than 5 microns using a long-working-distance microscope. Total internal reflection of edge illumination efficiency couples light into the entire optic to inspect for bulk artifacts, such as bubbles, inclusions, edge-cladding flaws and laser- induced damage as well as surface scratches and pits which propagate into the substrate. Surface contamination such as dust, fingerprints, coating flaws, and cleaning flaws are highlighted by external grazing illumination. The procedures permit accurate recording of the evolution of damage after many laser shots as well as correlation of damage from one optic to the next in a laser chain. 收起