摘要 : The electrical properties, surface morphology and interface characteristics of W/p-diamond contact before and after annealing have been investigated. It is shown that the as-fabricated W/p-diamond contact exhibited non-linear beha... 展开
作者 | Zhao~ D. Li~ F. N. Liu~ Z. C. Chen~ X. D. Wang~ Y. F. Shao~ G. Q. Zhu~ T. F. Zhang~ M. H. Zhang~ J. W. Wang~ J. J. Wang~ W. Wang~ H. X. |
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作者单位 | |
期刊名称 | 《Applied Surface Science》 |
页码/总页数 | 361-366 / 6 |
语种/中图分类号 | 英语 / O59 |
关键词 | Diamond I-V Ohmic contact TLM XPS Barrier height |
DOI | 10.1016/j.apsusc.2018.03.015 |
馆藏号 | O-115 |