摘要 : We present CMOS self-calibration and bias circuits for Josephson circuits. In Josephson technology, process variations in critical circuit parameters such as junction critical current, resistance, and inductance adversely affect t... 展开
作者 | Kishore~ S.V. Ghoshal~ U. |
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期刊名称 | 《IEEE Transactions on Applied Superconductivity 》 |
页码/总页数 | P.2644-2647 / 4 |
语种/中图分类号 | 英语 / TM26 TN3 |
关键词 | Circuits CMOS technology Josephson junctions Frequency Dynamic range Apertures Signal resolution SQUIDs Analog-digital conversion Critical current |
DOI | 10.1109/77.403133 |
馆藏号 | IELEP0015 |