[机翻] Josephson flash型A/D电路的CMOS自校准
    [期刊]
  • 《IEEE Transactions on Applied Superconductivity》 1995年5卷2期

摘要 : We present CMOS self-calibration and bias circuits for Josephson circuits. In Josephson technology, process variations in critical circuit parameters such as junction critical current, resistance, and inductance adversely affect t... 展开

作者 Kishore~ S.V.   Ghoshal~ U.  
期刊名称 《IEEE Transactions on Applied Superconductivity 》
页码/总页数 P.2644-2647 / 4
语种/中图分类号 英语 / TM26   TN3  
关键词 Circuits   CMOS technology   Josephson junctions   Frequency   Dynamic range   Apertures   Signal resolution   SQUIDs   Analog-digital conversion   Critical current  
DOI 10.1109/77.403133
馆藏号 IELEP0015
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