摘要 : A new method for determining the single-sideband noise figure of a device from double-sideband measurements is proposed which eliminates the need for tunable filters and hence greatly reduces the complexity and cost of performing ... 展开 A new method for determining the single-sideband noise figure of a device from double-sideband measurements is proposed which eliminates the need for tunable filters and hence greatly reduces the complexity and cost of performing accurate noise figure measurements. This paper compares results obtained to those obtained using a traditional single-sideband measurement system with a tuneable filter and provides a full error analysis of the new technique. The method also offers considerable possibilities for future use at higher (microwave) frequencies where YIG filters and image reject mixers are not readily available. 收起