[期刊]
  • 《Diffusion and Defect Data. Solid State Data, Part B. Solid State Phenomena》 2015年233/234卷

摘要 : Silicon (Si) is currently the basis of most of nanodevice technology, therefore ultrathin materials based on Si have the great advantage of easy integration into existing circuitry. First flat silicon nanoparticles have been obtai... 展开

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