摘要 : Simulating crop yield and yield variability requires long-term, high-quality daily weather data, including solar radiation, maximum (T-max) and minimum temperature (T-min), and precipitation. In many regions, however, daily weathe... 展开
作者 | Van Wart~ Justin Grassini~ Patricio Yang~ Haishun Claessens~ Lieven Jarvis~ Andrew Cassman~ Kenneth G. |
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作者单位 | |
期刊名称 | 《Agricultural and Forest Meteorology》 |
总页数 | 10 |
语种/中图分类号 | 英语 / S1 |
关键词 | Yield potential Yeild variability Weather data Crop simulation model |
馆藏号 | N2008EPST0006990 |