摘要 : We have developed a thermal microscope which has an InSb detector and optics optimized for the camera. Using this system, we evaluated maximum resolution of a 30x/numerical aperture 0.71 lens made of silicon and germanium, and ach... 展开
作者 | Arata~ I Isobe~ Y Ishizuka~ T |
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作者单位 | |
期刊名称 | 《Optical review》 |
总页数 | 3 |
语种/中图分类号 | 英语 / O43 |
关键词 | thermal imaging thermal microscopy thermal emission analysis InSb failure analysis semiconductor |
馆藏号 | N2008EPST0000947 |