[期刊]
  • 《Design automation for embedded systems》 2003年8卷2/3期

摘要 : Embedded electronics today are becoming increasingly complex, which makes their design and analysis more and more difficult. In this paper, we focus on the formal verification of embedded system designs at multiple levels of abstr... 展开

作者 XI CHEN   HARRY HSIEH   FELICE BALARIN   YOSINORI WATANABE  
期刊名称 《Design automation for embedded systems》
总页数 15
语种/中图分类号 英语 / TN40  
关键词 Formal Verification   Model Checking   Metropolis   Meta-Model   SPIN   LTL  
馆藏号 N2008EPST0003710
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