摘要 : Embedded electronics today are becoming increasingly complex, which makes their design and analysis more and more difficult. In this paper, we focus on the formal verification of embedded system designs at multiple levels of abstr... 展开
作者 | XI CHEN HARRY HSIEH FELICE BALARIN YOSINORI WATANABE |
---|---|
期刊名称 | 《Design automation for embedded systems》 |
总页数 | 15 |
语种/中图分类号 | 英语 / TN40 |
关键词 | Formal Verification Model Checking Metropolis Meta-Model SPIN LTL |
馆藏号 | N2008EPST0003710 |