摘要: This paper describes the technology, design features and reliability characterization methodology of a CMOS Active Pixel Sensor. Both overall chip reliability and pixel reliability are projected for the imagers.
| 作者 | Chen, Yuan Guertin, Steven M. Pain, Bedabrata Kayaii, Sammy | ||
|---|---|---|---|
| 原报告号 | 20070030861 | 总页数 | 5 |
| 报告类别/文献类型 | NASA / NTIS科技报告 | ||
| 关键词 | CMOS PIXELS CHIPS CMOS Active Pixel Sensors low temperature imaging sensor reliability pixel reliability reliability analysis CHARACTERIZATION RELIABILITY | ||
