[科技报告]AD  Jarvis, C. W.20

摘要: The Automatic Fabric Inspection System developed by Systronics Inc. for ClemsonApparel Research uses vision technology to acquire images of the fabric two

翻译摘要
作者 Jarvis, C. W.  
原报告号 ADA274522 总页数 20
报告类别/文献类型 AD / NTIS科技报告
关键词 Fabrics   Signal processing   Visual inspection   Video recording   Automatic   Images   Inspection   Output   Pictures   Pixels   Scale   Faults   Video signals  
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