摘要 : In this paper, we propose a process-variability-aware adaptive test flow that realizes efficient and comprehensive detection of parametric faults. A parametric fault is essentially a malfunction in a large-scale integration chip, ... 展开
作者 | Shintani~ M. Uezono~ T. Takahashi~ T. Hatayama~ K. Aikyo~ T. Masu~ K. Sato~ T. |
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作者单位 | |
期刊名称 | 《Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on》 |
页码/总页数 | 1056-1066 / 11 |
语种 | 英语 |
关键词 | Delay variability parametric faults path delay test statistical static timing analysis |
DOI | 10.1109/TCAD.2014.2305835 |
馆藏号 | IELEP0072 |