摘要 : An uncertainty analysis is presented for the National Institute of Standards and Technology (NIST) measurements of the noise parameters of amplifiers and transistors in both connectorized (coaxial) and on-wafer environments. We t... 展开
作者 | Randa~ J. |
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期刊名称 | 《Instrumentation and Measurement, IEEE Transactions on》 |
页码/总页数 | p.1146-1151 / 6 |
语种 | 英语 |
关键词 | Amplifier noise Monte Carlo (MC) measurement uncertainty noise figure noise measurement noise parameters transistor noise uncertainty |
DOI | 10.1109/TIM.2008.2007044 |
馆藏号 | IELEP0140 |