摘要 : In this paper a new method to design totally self-checking (TSC) checkers for a class of Borden codes is given and their applicability is discussed. The TSC checkers designed in this paper are impressively more efficient, with res... 展开
| 作者 | Haniotakis~ T. Paschalis~ A. |
|---|---|
| 期刊名称 | 《IEEE Transactions on Computers 》 |
| 页码/总页数 | P.1318-1322 / 5 |
| 语种/中图分类号 | 英语 / TP3 |
| 关键词 | Circuit faults Costs Design methodology Electrical fault detection Fault detection Fault tolerance Niobium Very large scale integration Redundancy Built-in self-test |
| DOI | 10.1109/12.475127 |
| 馆藏号 | IELEP0256 |
