摘要 : An experimental technique is described for observing the effects of switching transients in digital MOS circuits that perturb analog circuits integrated on the same die by means of coupling through the substrate. Various approache... 展开
作者 | Su~ D.K. Loinaz~ M.J. |
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期刊名称 | 《IEEE Journal of Solid-State Circuits》 |
页码/总页数 | P.420-430 / 11 |
语种/中图分类号 | 英语 / TN40 TN7 |
关键词 | Substrates Crosstalk CMOS technology Integrated circuit technology Circuit simulation Switching circuits Analog circuits Coupling circuits Digital circuits CMOS digital integrated circuits |
DOI | 10.1109/4.210024 |
馆藏号 | IELEP0242 |