摘要 : A wide variety of fault tolerance techniques for VLSI technology are examined. Device-, gate-, and function-levels fault models are described. The basic methods available to the designer of fault tolerance measures are introduced ... 展开 A wide variety of fault tolerance techniques for VLSI technology are examined. Device-, gate-, and function-levels fault models are described. The basic methods available to the designer of fault tolerance measures are introduced by surveying redundancy techniques. Techniques of fault detection that use space, time, and information redundancies, algorithm-based fault tolerance, in VLSI components, large-scale processor-level implementations of fault detection, fault tolerance in automated VLSI production systems are discussed. Reconfiguration of the system and recovery of system operation are described. Issues relating to the reconfiguration after discovery of a fault in fabrication or in operation are discussed. Recovery capabilities of a VLSI microprocessor are reviewed. 收起