摘要 : A system to measure the high frequency MR curve of thin films was developed. Two problems had to be solved to realize MR measurement at frequencies above several MHz, namely, to produce a high amplitude magnetic field and to devel... 展开
作者 | Yoshizawa~ N. Nakane~ H. |
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期刊名称 | 《IEEE Transactions on Magnetics》 |
页码/总页数 | P.3058-3060 / 3 |
语种/中图分类号 | 英语 / TM27 |
关键词 | Frequency measurement Transistors Electrodes Anisotropic magnetoresistance Magnetic field measurement Noise measurement Magnetic noise Noise level Probes Magnetic resonance |
DOI | 10.1109/20.801084 |
馆藏号 | IELEP0154 |