摘要 : This paper proposes a method of measuring the influence of digital noise on analog circuits using wide-band voltage comparators as noise detectors. Noise amplitude and r.m.s voltage are successfully measured by this method. A test... 展开
作者 | Makie-Fukuda~ K. Kikuchi~ T. |
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期刊名称 | 《IEEE Journal of Solid-State Circuits》 |
页码/总页数 | P.87-92 / 6 |
语种/中图分类号 | 英语 / TN40 TN7 |
关键词 | Noise measurement Integrated circuit measurements Integrated circuit noise Mixed analog digital integrated circuits Semiconductor device measurement Voltage Analog circuits Circuit noise Noise reduction Wideband |
DOI | 10.1109/4.341734 |
馆藏号 | IELEP0242 |