摘要 : Multiseed (msd) mutant sorghum [Sorghum bicolor (L.) Moench] lines with greatly increased seed numbers were developed. It was originally thought that the msd trait could increase grain yield several times in comparison with the wi... 展开
作者 | Dennis C. Gitz III Jeffrey T. Baker Zhanguo Xin John E. Stout Robert J. Lascano |
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作者单位 | |
期刊名称 | 《美国植物学期刊(英文)》 |
页码/总页数 | P.1503-1516 / 14 |
语种/中图分类号 | 汉语 / R73 |
关键词 | Sorghum Yield Yield Components msd Multiseed Yield Measurement Error |