摘要 :
This report is a tool to be used by the design engineer, manufacturer, and user to aid them in diagnosing failures in the large rolamite. It provides a tabular list of failure modes, the effect of the failure, and the degree to wh...
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This report is a tool to be used by the design engineer, manufacturer, and user to aid them in diagnosing failures in the large rolamite. It provides a tabular list of failure modes, the effect of the failure, and the degree to which the failure affects operation. (ERA citation 11:054513)
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摘要 :
It is assumed that the phenomenon under study is such that the time-to-failure may be modeled by an exponential distribution with failure rate lambda. For Bayesian analyses of the assumed model, the family of gamma distributions p...
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It is assumed that the phenomenon under study is such that the time-to-failure may be modeled by an exponential distribution with failure rate lambda. For Bayesian analyses of the assumed model, the family of gamma distributions provides conjugate prior models for lambda. Thus, an experimenter needs to select a particular gamma model to conduct a Bayesian reliability analysis. The purpose of this report is to present a methodology that can be used to translate engineering information, experience, and judgment into a choice of a gamma prior distribution. The proposed methodology assumes that the practicing engineer can provide percentile data relating to either the failure rate or the reliability of the phenomenon being investigated. For example, the methodology will select the gamma prior distribution which conveys an engineer's belief that the failure rate lambda simultaneously satisfies the probability statements, P(lambda less than 1.0 x 10 exp -3 ) equals 0.50 and P(lambda less than 1.0 x 10 exp -5 ) equals 0.05. That is, two percentiles provided by an engineer are used to determine a gamma prior model which agrees with the specified percentiles. For those engineers who prefer to specify reliability percentiles rather than the failure rate percentiles illustrated above, it is possible to use the induced negative-log gamma prior distribution which satisfies the probability statements, P(R(t sub 0 ) less than 0.99) equals 0.50 and P(R(t sub 0 ) less than 0.99999) equals 0.95, for some operating time t sub 0 . The report also includes graphs for selected percentiles which assist an engineer in applying the procedure. 28 figures, 16 tables. (ERA citation 02:061831)
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摘要 :
Failure free electronic systems - statistical quality measurement, adaptive voter, failure responsive system organizations, and medium communication
摘要 :
Analyzing emergency deceleration and descent of XB-70-1 airplane due to engine damage resulting from structural failure for supersonic transport data
摘要 :
Failure analysis is a critical element in the integrated circuit manufacturing industry. This paper reviews the changing role of failure analysis and describes major techniques employed in the industry today. Several advanced fail...
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Failure analysis is a critical element in the integrated circuit manufacturing industry. This paper reviews the changing role of failure analysis and describes major techniques employed in the industry today. Several advanced failure analysis techniques that meet the challenges imposed by advancements in integrated circuit technology are described and their applications are discussed. Future trends in failure analysis needed to keep pace with the continuing advancements in integrated circuit technology are anticipated.
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摘要 :
Failure analysis is a critical element in the integrated circuit manufacturing industry. This paper reviews the changing role of failure analysis and describes major techniques employed in the industry today. Several advanced fail...
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Failure analysis is a critical element in the integrated circuit manufacturing industry. This paper reviews the changing role of failure analysis and describes major techniques employed in the industry today. Several advanced failure analysis techniques that meet the challenges imposed by advancements in integrated circuit technology are described and their applications are discussed. Future trends in failure analysis needed to keep pace with the continuing advancements in integrated circuit technology are anticipated.
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