摘要 : Conventional methods of thermal analysis provide only a sample-averaged response. The instrument described here combines two measurement technologies, conventional thermal analysis and scanning probe microscopy, to provide materia... 展开 Conventional methods of thermal analysis provide only a sample-averaged response. The instrument described here combines two measurement technologies, conventional thermal analysis and scanning probe microscopy, to provide material scientists with analysis on the nanoscale. [References: 6] 收起