摘要 : Polarized light reflectometry is a powerful noncontact method for obtaining information about paper coating structure, roughness, and. optical properties. New instrumentation—the imaging reflectome-ter—makes reflectometry far more... 展开
作者 | Nick J. Elton Janet S. Preston |
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期刊名称 | 《Solutions! for People, Processes and Paper: The Official Publication of TAPPI & PIMA 》 |
总页数 | 1 |
语种/中图分类号 | 英语 / TS7 |
馆藏号 | N2008EPST0011542 |