国际刊号:
1743-5110
序号 | 标题 | 作者 | 起始页 | 操作 |
---|---|---|---|---|
1 | Digital maturity models: comparing manual and semi-automatic similarity assessment frameworks | Bruno Cognet, Jean-Philippe Pernot, Louis Rivest... | 291 | |
2 | Development of a framework for operational phase life assessment of machine tools using a structural approach | Kumar Sarthak, Girish Kumar, Ajith Tom James... | 317 | |
3 | Holistic definition of the digital twin | Martin Eigner, Alexander Detzner, Philipp Heiner Schmidt... | 343 | |
4 | Reliability-oriented life extension of mechatronic products: theory and application | Laudelino Vieira De Matos Filho, Victor Juliano De Negri, Antonio Carlos Valdiero... | 358 |