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序号 标题 作者 起始页 操作
1 Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM Firoozabadi S., Kukelhan P., Beyer A.... 113,550
2 Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope Huang S., Li H., Wang J.... 113,560
3 Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection Bitrus S., Rigger E., Entner D.... 113,567
4 Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process Jannis D., Velazco A., Beche A.... 113,568
5 Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides Basha A., Levi G., Amrani T.... 113,570
6 Comparison of detection limits of direct-counting CMOS and CCD cameras in EELS experiments Haruta M., Kurata H., Kikkawa J.... 113,577
7 Image difference metrics for high-resolution electron microscopy Ederer M., Loffler S. 113,578
8 The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias Bultema L.A., Schulz E.C., Tellkamp F.... 113,579
9 Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy Seki T., Murakami Y.O., Toyama S.... 113,580
10 Nondestructive and local mapping photoresponse of WSe2 by electrostatic force microscopy Jeon D., Kim H., Gu M.... 113,590