摘要: Argon ions were implanted into CuTe, CuSe, CuTeSeFe alloys. The breakdown electric field and the probability curves of the breakdown electric field were measured. The microhardness was also measured. Experimental results show that... 展开
| 作者 | Qiu Chensfeng Wei Shiping Zhang Qiaogen Wang Xiaotian Xu Shiru Yang Zhimao Ding Bingjun | ||
|---|---|---|---|
| 作者单位 | |||
| 文集名称 | 16th International Conference on Electrical Contacts (ICEC 1992) | ||
| 出版年 | 2009 | ||
| 出版社/出版地 | VDE Verlag GmbH / Berlin | ||
| 会议名称 | International Conference on Electrical Contacts | ||
| 开始页/总页数 | 109 / 2 | ||
| 会议日期/会议地点 | 19920907-11 / Loughborough | 会议年/会议届次 | 1992 / 16th |
| 中图分类号 | TM501.3-53 | ||
| 关键词 | ELECTRIC BREAKDOWN CONTACT MATERIALS IMPLANTATION | ||
| 馆藏号 | N2010EMST0005567 | ||
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