摘要: Measuring the performance of a cathode ray tube (CRT) or liquid crystal display (LCD) is necessary to enable end-to-end system modeling and characterization of currently used high performance analog imaging systems, such as 2nd Ge... 展开
作者 | Balvinder Kaur Jeff T. Olson Jonathan G. Hixson Philip I. Richardson Eric A. Flug | ||
---|---|---|---|
作者单位 | |||
文集名称 | Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI | ||
出版年 | 2015 | ||
出版社/出版地 | Society of Photo-Optical Instrumentation Engineers / Bellingham, Washington | ||
会议名称 | Conference on Infrared Imaging Systems: Design, Analysis, Modeling, and Testing | ||
开始页/总页数 | 945203-1 / 12 | ||
会议日期/会议地点 | 20150421-23 / Baltimore, Maryland | 会议年/会议届次 | 2015 / 26th |
中图分类号 | O43 TB96-53 | ||
关键词 | Cathode Ray Tube (CRT) Liquid Crystal Display (LCD) Photometer High Resolution Monitors Minimum Resolvable Temperature (MRT) Contrast Threshold Function (CTF) | ||
馆藏号 | N2015080600102884 |