摘要: This report describes the design of an integrated Built-In-Test (BIT) control unit which may be interfaced with selected missile control subsystems. The control unit design provides the capability to perform tests of the subsystem... 展开
| 作者 | Hoop, T. R. Thomas, E. K. | ||
|---|---|---|---|
| 原报告号 | ADA1272780 | 总页数 | 45 |
| 主办者 | Non Paid ADAS | ||
| 报告分类号 | [75C - Missile Launching & Support Systems] | ||
| 报告类别/文献类型 | AD / NTIS科技报告 | ||
| 关键词 | Test equipment Failure(Electronics) Guided missile components Power conditioning Test methods Malfunctions Electric power Power measurement Power supplies Monitoring Isolation Faults Detection Modules(Electronics) Display systems Analog to digital converters Central processing units Audiovisual aids Surface to surface missiles Air to surface missiles Flow charting Computer programs Voltage Control systems Circuits Interfaces Schematic diagrams Diagnostic equipment Peak power Test and evaluation Replacement BIT(Built In Tests) Fault detection Fault isolation Peakhold Tow missiles BITE(Built In Test Equipment) Multibus | ||
