[科技报告]AD  Donaldson, G. L., Illgner, J. J.323

摘要: This report presents the results of the design, fabrication and test effort of a MOS/LSI Integrated Circuit used in the XM587E2/XM724 Electronic Time Fuze designed by Harry Diamond Laboratories. The integrated circuit designed per... 展开

翻译摘要
作者 Donaldson, G. L.   Illgner, J. J.  
原报告号 ADA0149443 总页数 323
主办者 Non Paid ADAS
报告分类号 [49H - Semiconductor Devices79A - Ammunition, Explosives, & Pyrotechnics]
报告类别/文献类型 AD / NTIS科技报告
关键词 Metal oxide semiconductors   Integrated circuits   Fuze functioning elements   Time fuzes   Logic circuits   Scalers   Safety and arming(Ordnance)   Large scale integration   M-724 fuzes   Overhead safety circuits    
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