摘要: This report presents the results of the design, fabrication and test effort of a MOS/LSI Integrated Circuit used in the XM587E2/XM724 Electronic Time Fuze designed by Harry Diamond Laboratories. The integrated circuit designed per... 展开
作者 | Donaldson, G. L. Illgner, J. J. | ||
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原报告号 | ADA0149443 | 总页数 | 323 |
主办者 | Non Paid ADAS | ||
报告分类号 | [49H - Semiconductor Devices79A - Ammunition, Explosives, & Pyrotechnics] | ||
报告类别/文献类型 | AD / NTIS科技报告 | ||
关键词 | Metal oxide semiconductors Integrated circuits Fuze functioning elements Time fuzes Logic circuits Scalers Safety and arming(Ordnance) Large scale integration M-724 fuzes Overhead safety circuits |