摘要: A simple technique is introduced for measuring the refractive index of plane-parallel samples having thickness of the order of a millimeter. The refractive index values are reported for six bulk semiconductors, each index measured... 展开
作者 | Guha, S. Murray, M. J. Wei, J. Barnes, O. J. Slagle, E. J. | ||
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原报告号 | ADA611871 | 总页数 | 9 |
主办者 | Non Paid ADAS | ||
报告分类号 | [46C - Optics &, Lasers] | ||
报告类别/文献类型 | AD / NTIS科技报告 | ||
关键词 | REFRACTIVE INDEX ALLOYS BULK SEMICONDUCTORS DISPLACEMENT INSTRUMENTATION MEASUREMENT METROLOGY THICKNESS FOCAL DISPLACEMENT METHOD INFRARED WAVELENGTHS TERNARY ALLOYS PE62102F WUX0DY |