摘要: Atomic force microscopy was used to determine in situ the nm-scale morphological changes that occur on dielectric optical coatings as a result of laser illumination. Of particular interest is a process called laser conditioning in... 展开 Atomic force microscopy was used to determine in situ the nm-scale morphological changes that occur on dielectric optical coatings as a result of laser illumination. Of particular interest is a process called laser conditioning in which the damage thresho ... 收起