摘要: No abstract available.
| 作者 | buehler, m. g. blaes, b. r. | ||
|---|---|---|---|
| 原报告号 | N8629255 | 总页数 | 218 |
| 报告类别/文献类型 | NASA / NTIS科技报告 | ||
| 关键词 | Chips (Electronics) Cmos Electrical engineering Integrated circuits Large scale integration Microelectronics Quality control Very large scale integration Fault tolerance Field effect transistors Flip-flops Gates (Circuits) Single event upsets | ||
