摘要: The Nondestructive Evaluation (NDE) Group of the Optical Instrumentation Technology Branch at the NASA Glenn Research Center has developed a scanning system that uses guided waves to characterize materials and detect defects. The ... 展开
作者 | Martin, Richard E. Gyekenyeski, Andrew L. Roth, Don J. | ||
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原报告号 | N20050192414 | 总页数 | 3 |
主办者 | See Document ID 20050019494 | ||
报告类别/文献类型 | NASA / NTIS科技报告 | ||
关键词 | Detection Defects Automatic control Scanners Composite materials Ultrasonic wave transducers Nondestructive tests Polymer matrix composites Analog to digital converters Loads Forces Damage Plates Structural members Thermography |