摘要: A microprobe analysis technique which has the potential for quantitative measurements of surface and bulk concentration as well as depth profiles has been investigated. This technique is termed Profile Analysis using Laser Assiste... 展开
作者 | Freedman, A. McCurdy, K. Stinespring, C. | ||
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原报告号 | ADA200955 | 总页数 | 33 |
报告类别/文献类型 | AD / NTIS科技报告 | ||
关键词 | Gallium arsenides Group III compounds Group V compounds Semiconductors Doping Impurities Ablation Air Force Control Deficiencies Density Depth Energy Fluorescence Laser induced fluorescence Lasers Materials Measurement Microprobes Profiles Pulsed l |