摘要: Traditionally the testing of microelectronics for single event upset (SEU)sensitivity has involved actual exposure to the cosmic ray environment by high altitude flight programs or the simulation of the cosmic ray environment thro... 展开
作者 | Costantine, A. G. | ||
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原报告号 | AD-A223613 | 总页数 | 104 |
报告类别/文献类型 | AD / NTIS科技报告 | ||
关键词 | Microelectronics Test equipment Radiation damage Cosmic rays Cross sections Energy transfer Environments High altitude Linearity Measurement Saturation Simulation Theses Californium Fission products |