摘要: Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends and challenges of interconnect design as the techno... 展开
作者 | Cong J. Zhigang Pan | ||
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文集名称 | Computer-Aided Design, 1997. Digest of Technical Papers., 1997 IEEE/ACM International Conference on | ||
出版年 | 1997 | ||
卷/页码 | 1997 / P.478-485 | 开始页/总页数 | 00000478 / 8 |
会议日期 | 1997 | 会议年 | 1997 |
中图分类号 | TN | ||
关键词 | Integrated circuit interconnections | ||
馆藏号 | IEEE-IEL |