摘要 : SIM techniques based on synchronous phase shift and vertical scanning have been proposed for fast and precise three-dimensional (3D) measurement. These methods are also named as time-domain phase shift (TSIM) method. In these meth... 展开
作者 | Xie~ Zhongye Sun~ Jinghua Ding~ Wenxia Li~ BoYao Shen~ Bo |
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作者单位 | |
期刊名称 | 《Optics and Lasers in Engineering》 |
页码/总页数 | 107316.1-107316.10 / 10 |
语种/中图分类号 | 英语 / O43 |
关键词 | SURFACE PROFILOMETRY |
DOI | 10.1016/j.optlaseng.2022.107316 |
馆藏号 | O-047 |