摘要 : The flicker noise modeling is of great significance in many applications of high electron mobility transistors (HEMTs) in low noise circuits. In this letter, a novel charge-based flicker noise model for HEMTs is proposed, which in... 展开
作者 | Luo~ Haorui Yan~ Xu Hu~ Wenrui Guo~ Yongxin |
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作者单位 | |
期刊名称 | 《IEEE microwave and wireless components letters》 |
页码/总页数 | 125-128 / 4 |
语种/中图分类号 | 英语 / TN6 |
关键词 | MODFETs HEMTs Adaptation models Integrated circuit modeling Logic gates Semiconductor device modeling Mathematical models Flicker noise high electron mobility transistors (HEMTs) noise model |
DOI | 10.1109/LMWC.2021.3118708 |
馆藏号 | IELEP0165 |