摘要 : Electron backscattered diffraction (EBSD) is used to study the effect of huge-density structural vacancies (SVs) on the twins in defect zinc-blende (DZB) crystal Hg_3In_2Te_6 (MIT) grown by the Bridgman method. Comparing with typi... 展开
作者 | Lin Luo Wanqi Jie Yadong Xu Tao Wang Yuanyuan Du Li Fu |
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作者单位 | |
期刊名称 | 《Journal of Crystal Growth》 |
页码/总页数 | 54-59 / 6 |
语种/中图分类号 | 英语 / 1-824 |
关键词 | A1. Planar defects A1. Point defects A2. Bridgman technique B2. Semiconducting mercury compounds B2. Semiconducting ternary compounds |
DOI | 10.1016/j.jcrysgro.2014.09.014 |
馆藏号 | O-061 |